MIL DESC 5962-86811 PDF

Published Date: 05/18/2006

MICROCIRCUIT, DIGITAL, ECL, TWO-MODULUS PRESCALER, DIVIDE BY 10 AND 11, MONOLITHIC SILICON(SUPERSEDING DESC 5962-87749A)

Published Date: 06/03/2003

MICROCIRCUIT, HYBRID, LINEAR, WIDEBAND, OPERATIONAL AMPLIFER (SUPERSEDING DESC 5962-90835C)

Published Date: 04/10/2007

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON(SUPERSEDING DESC 5962-93149)

Published Date: 04/02/2007

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 9-BIT BUS INTERFACE D-TYPE LATCH WITH 3-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-95712)

Published Date: 01/11/2017

Walkway Surface Auditing Procedure for the Measurement of Walkway Slip Resistance

Published Date: 03/12/2021

Walkway Surface Auditing Procedure for the Measurement of Walkway Slip Resistance

Published Date: 10/13/2009

Test Method for Measuring Wet SCOF of Common Hard-Surface Floor Materials

Published Date: 2020

Test Method for Measuring Wet SCOF of Common Hard-Surface Floor Materials

Published Date: 2020

Test Method for Determining the Impact on Wet Coefficients of Friction of Various Chemical or Physical Walkway Surface Cleaners and Treatments on Common Hard-Surface Flooring Materials

Published Date: 01/18/2012

Test Method for Measuring Wet DCOF of Common Hard-Surface Floor Materials