MIL DESC 5962-96610 PDF

MIL DESC 5962-96610 PDF

Name:
MIL DESC 5962-96610 PDF

Published Date:
12/14/1995

Status:
Active

Description:

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-INPUT NAND/AND GATE, MONOLITHIC SILICON

Publisher:
Military Specifications and Standards

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$7.2
Need Help?

File Size : 1 file , 1.3 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 14
Published : 12/14/1995

History


Related products

QPL QML-38535-20
Published Date: 02/02/2007
INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL REQUIREMENTS FOR(SUPERSEDING QML-38535-19)
$38.7
MIL DESC 5962-92181
Published Date: 06/07/1993
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD 2-INPUT NOR GATE, TTL COMPATIBLE, MONOLITHIC SILICON(S/S BY DSCC 5962-92181A)
$8.7
MIL DSCC 5962-87782K
Published Date: 01/11/2006
MICROCIRCUIT, LINEAR, POSITIVE 5-VOLT REGULATOR, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-87782J)
$8.7
MIL DSCC 5962-96525D
Published Date: 08/24/2005
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, HEX INVERTER SCHMITT TRIGGER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-96525)
$7.2

Best-Selling Products

ASNT 0008
Published Date: 2004
Radiographic Interpretation
ASNT 0140
Published Date: 2012
Nondestructive Testing Handbook, Vol. 10: Overview, 3rd ed.
$54.6
ASNT 0141
Published Date: 2017
Nondestructive Testing Handbook, Vol. 2: Leak Testing (LT), 4th ed.
$61.8
ASNT 0141
Published Date: 1997
Nondestructive Testing Handbook, Third Edition: Volume One, Leak Testing
ASNT 0142
Published Date: 1999
Nondestructive Testing Handbook - Third Edition - Volume 2: Liquid Penetrant Tests