MIL DSCC 5962-03250A PDF

Published Date: 06/27/2006

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 40,000 GATES WITH 18K OF INDEPENDENT SRAM, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-03250A)

Published Date: 07/04/2004

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 40,000 GATES WITH 18K OF INDEPENENT SRAM, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-03250)(S/S BY DSCC 5962-03250B)

Published Date: 01/27/1994

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, EE PROGRAMMABLE ARRAY LOGIC, MONOLITHIC SILICON (SUPERSEDING DESC 5962-89840)(S/S BY DSCC 5962-89840D)

Published Date: 11/08/1995

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, BINARY RATE MULTIPLIER, MONOLITHIC SILICON

Published Date: 05/28/2004

MICROCIRCUIT, MEMORY, DIGITAL, SRAM, 512K X 8-BIT, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-95613G)

Published Date: 01/13/2005

MICROCIRCUITS, DIGITAL, ADVANCED LOW POWER SCHOTTKYL TTL, DUAL 4-BIT TRANSPARENT LATCH, MONOLITHIC SILICON (SUPERSEDING DESC 84032B)

Published Date: 04/26/2006

Short-circuit currents - Calculation of effects - Part 2: Examples of calculation.

Published Date: 02/09/2005

Insulating materials - Industrial rigid laminated sheets based on thermosetting resins for electrical purposes - Part 4: Typical values

Published Date: 02/17/2010

Short-circuit currents in three-phase a.c. systems - Part 2: Data of electrical equipment for short-circuit current calculations.

Published Date: 06/28/2006

Electromagnetic compatibility (EMC) - Part 2-8: Environment - Voltage dips and short interruptions on public electric power supply systems with statistical measurement results (IEC/TR 61000-2-8:2002)

Published Date: 07/19/2006

Electromagnetic compatibility (EMC) - Part 3: Limits - Section 6: Assessment of emission limits for distorting loads in MV and HV power systems - Basic EMC publication (IEC/TR 61000-3-6:1996)

Published Date: 03/15/2006

Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 3: Protocol for the preparation of conformity verification reports for the IEC 61010 2nd edition series .