MIL DSCC 5962-07213 PDF

Published Date: 01/26/1993

MICROCIRCUIT, LINEAR, 8-BIT, FLASH, A/D CONVERTER, HYBRID (SUPERSEDING DESC 5962-89979)(S/S BY DSCC 5962-89979B)

Published Date: 04/07/1992

MICROCIRCUIT,DIGITAL,CMOS,PRESETTABLE, BINARY/DECADE UP/DOWN COUNTER,MONOLITHIC SILICON(S/S BY DSCC 81016F)

Published Date: 07/15/2005

MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS UP/DOWN DECADE COUNTER WITH ASYCHRONOUS RESET, MONOLITHIC SILICON

Published Date: 08/19/2004

MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY, TTL HEX D-TYPE FLIP-FLOPS WITH ENABLE, MONOLITHIC SILICON (SUPERSEDING DESC 5962-89925)

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY