MIL DSCC 5962-87555F PDF

Published Date: 03/15/2007

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-87555E)

Published Date: 07/07/2005

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-87555D)(S/S BY DSCC 5962-87555F)

Published Date: 03/12/1996

MICROCIRCUIT, MEMORY, DIGITAL CMOS, PROGRAMMABLE LOGIC CELL ARRAY, MONOLITHIC SILICON

Published Date: 12/06/2005

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW-POWER SCHOTTKY TTL, COUNTER, MONOLITHIC SILICON(SUPERSEDING DESC 5962-86840B)

Published Date: 07/17/2000

MICROCIRCUIT, LINEAR, 5 VOLT VOLTAGE REFERNCE, MONOLITHIC SILICON (SUPERSEDING DESC 5962-90519)

Published Date: 04/27/2006

MICROCIRCUIT, MEMORY, DIGITAL, 8K X 8 NONVOLATILE STATIC RAM WITH AUTOMATIC STORE ON POWER LOSS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-94599A)

Published Date: 02/04/2009

Information technology. Software measurement. Functional size measurement. Part 2: Conformity evaluation of software size measurement methods to ISO/IEC 14143-1:1998.

Published Date: 12/17/2004

Information technology -- Software product evaluation -- Part 1: General overview

Published Date: 12/17/2004

Software engineering -- Product evaluation -- Part 2: Planning and management

Published Date: 07/27/2005

Software engineering -- Product evaluation -- Part 3: Process for developers

Published Date: 12/12/2007

Software engineering. Product evaluation. Part 6: Documentation of evaluation modules. (ISO/IEC 14598-6:2001)

Published Date: 12/02/2009

Systems and software engineering. Measurement process