MIL DSCC 5962-87739G PDF

Published Date: 08/18/1988

MICROCIRCUIT, LINEAR, BALANCED MODULATOR/ DEMODULATOR, MONOLITHIC SILICON

Published Date: 02/08/1993

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL BUFFER/LINE DRIVER, WITH INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON(S/S BY DSCC 5962-92184B)

Published Date: 06/20/2006

MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON(SUPERSEDING DESC 5962-90989)

Published Date: 05/28/2004

MICROCIRCUIT, MEMORY, DIGITAL, SRAM, 512K X 8-BIT, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-95613G)

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings