MIL DSCC 5962-88742A PDF

Published Date: 08/19/2003

MICROCIRCUITS, LINEAR, QUAD OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/110B)

Published Date: 03/06/1995

MICROCIRCUIT, DIGITAL, CMOS SERIALLY CONTROLLED ACCESS NETWORK, PARALLEL/SERIAL CONVERTER, TTL COMPATIBLE INPUTS, CMOS OUTPUTS, MONOLITHIC SILICON

Published Date: 01/29/2007

MICROCIRCUIT, HYBRID, LINEAR, 3.3-VOLT, SINGLE CHANNEL, DC-DC CONVERTER(SUPERSEDING DSCC 5962-01501B)

Published Date: 08/25/2004

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW-POWER SCHOTTKY, TTL, 10BIT BUS INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-90616)

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY