MIL DSCC 5962-89556A PDF

Published Date: 08/16/1991

MICROCIRCUIT, MEMORY, DIGITAL, CMOS EE PROGRAMMABLE READ ONLY MEMORY 246 X 16 MONOLITHIC SILICON

Published Date: 11/15/2005

MICROCIRCUITS, DIGITAL, CMOS, UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON(SUPERSEDING DESC 5962-88678A)

Published Date: 01/05/2001

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL BUS TRANSCEIVER AND REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-93242)

Published Date: 11/01/2001

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, SYNCHROUNOUS 4-BIT UP/DOWN BCD DECADE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-96563)

Published Date: 12/01/2001

Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Basic principals

Published Date: 12/01/2003

Inspection of measuring and test equipment - Instructions for the inspection of measuring and test equipment for geometrical quantities - Uncertainty of measurement

Published Date: 11/01/2001

Inspection of measuring and test equipments - Test instructions for micro meters

Published Date: 07/01/2005

Draft Document - Inspection of measuring and test equipment - Test instruction for micro meters for screw thread measurement

Published Date: 04/01/2010

Inspection of measuring and test equipment - Test instruction for micrometers for screw thread measurement and other measurement purposes

Published Date: 08/01/2002

Inspection of measuring and test equipment - Test instructions for micro meters with dial indicator