MIL DSCC 5962-90838C PDF

Published Date: 03/08/2006

MICROCIRCUIT, HYBRID, LINEAR, HIGH CURRENT, HIGH POWER, DUAL, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-90838B)

Published Date: 11/16/2005

MICROCIRCUIT, LINEAR, HIGH CURRENT, HIGH-POWER, DUAL OPERATIONAL AMPLIFIER, HYBRID(SUPERSEDING DESC 5962-90838A)(S/S BY DSCC 5962-90838C)

Published Date: 04/18/2006

MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D-TYPE FLIP-FLOP WITH CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-87656A)

Published Date: 11/15/2001

MICROCIRCUIT, LINEAR, 12-BIT, SERIAL SIX MICROSECOND ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON (SUPERSEDING DESC 5962-94755)

Published Date: 12/30/2005

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE (IN-SYS REPROGRAMMABLE), 64 MACROCELL, PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-99519A)

Published Date: 07/08/2004

MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS LOGIC OCTAL D-TYPE FLIP FLOP 3-STATE, POSITIVE EDGE TRIGGERED, MONOLITHIC SILICON

Published Date: 04/01/2020

Risk management - Risk assessment techniques (Adopted IEC 31010:2019, second edition, 2019-06)

Published Date: 06/01/2012

CAN/CSA-IEC 61000-4-15:12 - Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications (Adopted IEC 61000-4-15:2010, edition 2.0, 2010-08)

Published Date: 10/01/2014

Electromagnetic compatibility (EMC) - Part 4-18: Testing and measurement techniques - Damped oscillatory wave immunity test (Adopted IEC 61000-4-18:2011, edition 1:2006 consolidated with amendment 1:2010)

Published Date: 06/30/2012

Electromagnetic Compatibility (EMC) - Part 4-2: Testing and Measurement Techniques - Electrostatic Discharge Immunity Test (Adopted CEI/IEC 61000-4-2:1995 + A1:1998, edition 1.1, 1999-05)

Published Date: 05/01/2021

Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test (IEC 61000-4-3:2006+A1:2007+A2:2010, IDT)

Published Date: 08/05/2022

Amendment 1 to Electromagnetic compatibility (EMC) - Part 4-30: Testing and measurement techniques - Power quality measurement methods (Adopted IEC 61000-4-30:2015, third edition, 2015-02)