MIL DSCC 5962-90899D PDF

Published Date: 12/21/2006

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K X 8-BIT FLASH EEPROM, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-90899C)

Published Date: 11/16/1999

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K X 8-BIT FLASH EEPROM, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-90899B)(S/S BY DSCC 5962-90899D)

Published Date: 04/25/1991

MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, DECADE COUNTER/DIVIDER WITH 10 DECODED OUTPUTS, MONOLITHIC SILICON

Published Date: 10/29/2001

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 3.3 V, 32K X 8-BIT, MONOLITHIC SILICON

Published Date: 07/13/1999

MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL 4-STAGE BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-89890)

Published Date: 07/10/2002

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, QUAD BUFFER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-93253A)

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY