MIL DSCC 5962-91694E PDF

Published Date: 04/16/1987

MICROCIRCUITS, DIGITAL, ECL, QUAD 2-INPUT OR GATE, MONOLITHIC SILICON

Published Date: 01/24/1989

MICROCIRCUITS,LINEAR ADJUSTABLE,PREISION VOLTAGE REFERENCE,SHUNT REGULATOR,MONOLITHIC SILICON (SUPERSEDING DESC 84109)

Published Date: 02/21/2003

MICROCIRCUIT, MEMORY, DIGITAL, CMOS 1024K X 8-BIT, (8 M) RADIATION-HARDENED, LOW VOLTAGE SRAM, MULTICHIP MODULE (SUPERSEDING DSCC 5962-01532A)

Published Date: 12/12/2002

MICROCIRCUIT, DIGITAL, CMOS, THREE-PORT CABLE TRANSCEIVER/ARBITER, MONOLITHIC SILICON

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY