MIL DSCC 5962-92050B PDF

Published Date: 05/24/1990

MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON

Published Date: 03/31/1994

MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Published Date: 02/10/1995

MICROCIRCUIT, DIGITAL, CMOS, QUAD ELECTRICALLY ERASABLE PROGRAMMABLE POTENTIOMETER, MONOLITHIC SILICON

Published Date: 02/06/2006

MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 512K X 32-BIT, STATIC RANDOM ACCESS MEMORY, CMOS

Published Date: 04/26/2006

Short-circuit currents - Calculation of effects - Part 2: Examples of calculation.

Published Date: 02/09/2005

Insulating materials - Industrial rigid laminated sheets based on thermosetting resins for electrical purposes - Part 4: Typical values

Published Date: 02/17/2010

Short-circuit currents in three-phase a.c. systems - Part 2: Data of electrical equipment for short-circuit current calculations.

Published Date: 06/28/2006

Electromagnetic compatibility (EMC) - Part 2-8: Environment - Voltage dips and short interruptions on public electric power supply systems with statistical measurement results (IEC/TR 61000-2-8:2002)

Published Date: 07/19/2006

Electromagnetic compatibility (EMC) - Part 3: Limits - Section 6: Assessment of emission limits for distorting loads in MV and HV power systems - Basic EMC publication (IEC/TR 61000-3-6:1996)

Published Date: 03/15/2006

Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 3: Protocol for the preparation of conformity verification reports for the IEC 61010 2nd edition series .