MIL DSCC 5962-95549B PDF

Name:
MIL DSCC 5962-95549B PDF

Published Date:
02/22/2006

Status:
Active

Description:

MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-95549A)

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 72 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	12
Published :	02/22/2006

History

MIL DSCC 5962-95549B

Published Date: 02/22/2006

MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-95549A)

$7.2

MIL DSCC 5962-95549A

Published Date: 03/01/2001

MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATORS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-95549)(S/S BY DSCC 5962-95549B)

$7.2

Related products

MIL DESC 5962-90748

Published Date: 10/04/1990

MICROCIRCUITS, DIGITAL, BIPOLAR, CMOS, OCTAL BUFFERS AND LINE DRIVERS, TTL COMPATIBLE, MONOLITHIC SILICON(S/S BY DSCC 5962-90748A)

$7.2

MIL DESC 5962-96851

Published Date: 09/05/1996

MICROCIRCUIT, DIGITAL, ADVANCED HIGH SPEED CMOS, OCTAL BUFFER/DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, NEED

$7.2

MIL DSCC 5962-05207B

Published Date: 03/05/2007

MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MIL-STD-1750 INSTRUCTION SET ARCHITECTURE, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-05207A)

$10.2

MIL DSCC 5962-90940A

Published Date: 05/09/2006

MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-90940)

$7.2

Best-Selling Products

ISO/TTA 1:1994

Published Date: 04/01/1994

Advanced technical ceramics - Unified classification system

$55.5

ISO/TTA 2:1997

Published Date: 04/01/1997

Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures

$33.3

ISO/TTA 3:2001

Published Date: 09/01/2001

Polycrystalline materials - Determination of residual stresses by neutron diffraction

$55.5

ISO/TTA 4:2002

Published Date: 11/01/2002

Measurement of thermal conductivity of thin films on silicon substrates

$41.4

ISO/TTA 5:2007

Published Date: 10/01/2007

Code of practice for creep/fatigue testing of cracked components

$75