MIL DSCC 5962-95666D PDF

Name:
MIL DSCC 5962-95666D PDF

Published Date:
05/02/2007

Status:
Active

Description:

MICROCIRCUIT, LINEAR, DUAL/QUAD, RAIL-TO RAIL, LOW POWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-95666C)

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 73 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	13
Published :	05/02/2007

History

MIL DSCC 5962-95666D

Published Date: 05/02/2007

MICROCIRCUIT, LINEAR, DUAL/QUAD, RAIL-TO RAIL, LOW POWER OPERATIONAL AMPLIFIER, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-95666C)

$7.2

MIL DSCC 5962-95666C

Published Date: 02/26/2001

MICROCIRCUIT, LINEAR, DUAL/QUAD, RAIL-TO-RAIL, LOW POWER, OPERRATIONAL AMPLIFIER, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-95666B)

$7.2

Related products

MIL DESC 5962-90906

Published Date: 10/01/1990

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, TTL COMPATIBLE INPUTS, DUAL 1-OF-4 DATA SELECTORS, THREE-STATE OUTPUTS, MONOLITHIC SILICON(S/S BY DSCC 5962-90906A)

$7.2

MIL DSCC 5962-02551A

Published Date: 05/03/2007

MICROCIRCUIT, HYBRID, LINEAR, 12 VOLT, SINGLE CHANNEL, DC/DC CONVERTER(SUPERSEDING DSCC 5962-02551)

$7.2

MIL DSCC 5962-86821C

Published Date: 06/18/2004

MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, BCD-TO-DECIMAL DECODER, MONOLITHIC SILICON (SUPERSEDING DESC 5962-86821B)

$7.2

MIL DSCC 5962-88504D

Published Date: 08/18/2006

MICROCIRCUIT, DIGITAL, BIPOLAR, FIELD PROGRAMMABLE, LOGIC ARRAY (FPLA), MONOLITHIC SILICON(SUPERSEDING DSCC 5962-88504C)

$7.2

Best-Selling Products

DIN/IEC 212

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

DIN/IEC 60512-2 Amendment 1

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

DIN/IEC 60512-2

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

DIN/IEC 60512-3

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

DIN/IEC 60512-4

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

DIN/IEC 60512-5

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY