MIL DSCC 5962-96623C PDF

Name:
MIL DSCC 5962-96623C PDF

Published Date:
11/19/2003

Status:
Active

Description:

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 8-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON(SUPERSEDING DESC 5962-96623)

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 160 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	25
Published :	11/19/2003

History

Related products

MIL DESC 5962-88561B

Published Date: 04/27/1993

MICROCIRCUIT,LINEAR,PRECISION,6.9 VOLT VOLTAGE REFERENCE,MONOLITHIC SILICON

$7.2

MIL DESC 5962-93178

Published Date: 03/18/1994

MICROCIRCUIT, LINEAR, 64 GREY SHADE, 128 OUTPUT, COLUMN DRIVER, MONOLITHIC SILICON, TAPE AUTOMATED BOND TECHNOLOGY

$8.7

MIL DESC 5962-96597

Published Date: 07/11/1996

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, DUAL 4-INPUT NOR GATE, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(S/S BY DSCC 5962-96597B)

$7.2

MIL DSCC 5962-89513B

Published Date: 08/01/2006

MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL D REGISTER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON(SUPERSEDING DESC 5962-89513)

$7.2

Best-Selling Products

ISO/TTA 1:1994

Published Date: 04/01/1994

Advanced technical ceramics - Unified classification system

$55.5

ISO/TTA 2:1997

Published Date: 04/01/1997

Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures

$33.3

ISO/TTA 3:2001

Published Date: 09/01/2001

Polycrystalline materials - Determination of residual stresses by neutron diffraction

$55.5

ISO/TTA 4:2002

Published Date: 11/01/2002

Measurement of thermal conductivity of thin films on silicon substrates

$41.4

ISO/TTA 5:2007

Published Date: 10/01/2007

Code of practice for creep/fatigue testing of cracked components

$75