MIL DSCC 5962-98627A PDF

Published Date: 03/12/2007

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-98627)

Published Date: 06/30/1998

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS W/CLEAR AND PRESET, MONOLITHIC SILICON(S/S BY DSCC 5962-98627A)

Published Date: 10/22/2002

MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON (SUPERSEDING DESC 5962-93267)

Published Date: 07/16/2003

MICROCIRCUIT, HYBRID, LINEAR, 5-VOLT, DUAL CHANNEL, DC/DC CONVERTER (SUPERSEDING DSCC 5962-94659B)

Published Date: 03/08/2005

MICROCIRCUIT, LINEAR, LOW POWER, LOW OFFSET, DUAL VOLTAGE COMPARATORS, MONOLITHIC SILICON

Published Date: 12/15/2006

MICROCIRCUIT, DIGITAL-LINEAR, DUAL 10-BIT 200 MSPS DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON(SUPERSEDING DSCC V62/06638)

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings