MIL DSCC 5962-99521A PDF

Published Date: 01/05/2006

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE (IN-SYS REPROGRAMMABLE) 128 MACROCELL PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-99521A)

Published Date: 12/01/2000

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ALTERABLE (IN-SYS REPROGRAMMABLE) 128 MACROCELL PROGRAMMABLE) 128 MACROCELL PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-99521)(S/S BY DSCC 5962-99521B)

Published Date: 12/03/1999

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 8-BIT UVEPROM, MONOLITHIC SILICON (SUPERSEDING DESC 5962-87661C)

Published Date: 12/05/2006

MICROCIRCUIT, LINEAR, BIPOLAR HEX NTDS DRIVER, MONOLITHIC SILICON(SUPERSEDING DESC 5962-88581)

Published Date: 09/04/2001

MICORCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON (SUPERSEDING DESC 5962-96536)

Published Date: 12/21/2001

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCE CMOS, OCTAL BUFFER AND LINE DRIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-96570)

Published Date: 11/26/2001

Fire hazard testing. Heat release-Summary and relevance of test methods