MIL DSCC V62/07608 PDF

Published Date: 09/18/1997

MICROCIRCUIT, MEMEORY, DIGITAL, RADIATION-HARDENED, CMOS/SOS, 8K X 8 STATIC RAM, MONOLITHIC SILICON (SUPERSEDING DESC 5962-95823)

Published Date: 12/20/2006

MICROCIRCUIT, LINEAR, DUAL, DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-89882B)

Published Date: 08/15/2005

MICROCIRCUIT, HYBRID, ELECTRICALLY ERASABLE PROGRAMMABLE READ ONLY MEMORY, 128K X 16-BIT(SUPERSEDING DESC 5962-96689)

Published Date: 03/18/2005

MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 10-TO-4 LINE PRIORITY ENCODER, MONOLITHIC SILICON(SUPERSEDING DSCC 84064D)

Published Date: 12/01/2001

Inspection of measuring and test equipment - Instructions to inspect measuring and test equipment for geometrical quantities - Basic principals

Published Date: 12/01/2003

Inspection of measuring and test equipment - Instructions for the inspection of measuring and test equipment for geometrical quantities - Uncertainty of measurement

Published Date: 11/01/2001

Inspection of measuring and test equipments - Test instructions for micro meters

Published Date: 07/01/2005

Draft Document - Inspection of measuring and test equipment - Test instruction for micro meters for screw thread measurement

Published Date: 04/01/2010

Inspection of measuring and test equipment - Test instruction for micrometers for screw thread measurement and other measurement purposes

Published Date: 08/01/2002

Inspection of measuring and test equipment - Test instructions for micro meters with dial indicator