MIL MIL-D-28803/2A PDF

Published Date: 09/03/2013

Display, Optoelectronic, Segmented Readouts, Backlighted, General Specification for

Published Date: 12/09/2011

SEMICONDUCTOR DEVICE, COUPLER, OPTOELECTRIC, SOLID STATE; TYPES 4N22, 4N23, 4N23A, 4N24, 4N24A, 4N22U, 4N22AU, 4N23U 4N23AU, 4N24U, 4N24AU; JAN, JANTX, JANTXV, AND JANS

Published Date: 02/15/2019

COUPLER, OPTO ELECTRONIC, SEMICONDUCTOR DEVICE, SOLID STATE TYPES, 4N47A, 4N48, 4N48A, 4N49, 4N49A, 4N47U, 4N48U, AND 4N49U, JAN, JANTX, JANTXV, AND JANS

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY