MIL MIL-M-28787/329 PDF

Published Date: 08/09/1982

MODULES, STANDARD ELECTRONIC DIODE, PROGRAMMABLE, DIGITAL, KEY CODE ABE (SUPERSEDING MIL-M-28787/22B)

Published Date: 08/03/1983

MODULE, STANDARD ELECTRONIC GATE, NOR, KEY CODE AME (SUPERSEDING MIL-M-28787/249)

Published Date: 11/14/1984

MODULES, STANDARD ELECTRONIC CONVERTER, S/D, KEY CODE JAP

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY