MIL MIL-M-38510/153B PDF

MIL MIL-M-38510/153B PDF

Name:
MIL MIL-M-38510/153B PDF

Published Date:
02/22/2005

Status:
Active

Description:

MICROCIRCUITS, DIGITAL, TTL, QUADRUPLE BUS BUFFER GATES WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON (SEE BASE FOR INACTIVATION NOTICE) (SUPERSEDING MIL-M-38510/153A)

Publisher:
Military Specifications and Standards

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$7.2
Need Help?

File Size : 1 file , 140 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 16
Published : 02/22/2005

History

MIL MIL-M-38510/153B
Published Date: 02/22/2005
MICROCIRCUITS, DIGITAL, TTL, QUADRUPLE BUS BUFFER GATES WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON (SEE BASE FOR INACTIVATION NOTICE) (SUPERSEDING MIL-M-38510/153A)
$7.2
MIL MIL-M-38510/153A
Published Date: 03/11/1985
MICROCIRCUIT, DIGITAL, TTL, QUADRUPLE BUS BUFFER GATES WITH THREE STATE OUTPUTS, MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/153) (S/S BY MIL-M-38510/153B)
$7.2

Related products

MIL DESC 5962-87538
Published Date: 01/24/1990
MICROCIRCUIT, LINEAR, SINGLE 16-CHANNEL ANALOG MUX/DMUX WITH OVERVOLTAGE PROTECTION MONOLITHIC SILICON
$7.2
MIL DSCC 5962-05240
Published Date: 06/20/2006
MICROCIRCUIT, HYBRID, 5 VOLT, SINGLE CHANNEL, DC/DC CONVERTER
$7.2
MIL DSCC 5962-86834B
Published Date: 01/05/2006
MICROCIRCUIT, DIGITAL, ADVANCED SCHOTTKY TTL, QUAD NONINVERTING BUS TRANSCEIVERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-86834A)
$7.2
MIL DSCC 5962-90752A
Published Date: 05/04/2006
MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, OCTAL BUS TRANSCEIVER WITH INVERTING THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON(SUPERSEDING DESC 5962-90752)
$7.2

Best-Selling Products

ISO/TTA 1:1994
Published Date: 04/01/1994
Advanced technical ceramics - Unified classification system
$55.5
ISO/TTA 2:1997
Published Date: 04/01/1997
Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures
$33.3
ISO/TTA 3:2001
Published Date: 09/01/2001
Polycrystalline materials - Determination of residual stresses by neutron diffraction
$55.5
ISO/TTA 4:2002
Published Date: 11/01/2002
Measurement of thermal conductivity of thin films on silicon substrates
$41.4
ISO/TTA 5:2007
Published Date: 10/01/2007
Code of practice for creep/fatigue testing of cracked components
$75