MIL MIL-M-38510/349B PDF

Published Date: 05/12/2004

MICROCIRCUITS, DIGITAL, BIPOLAR ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/349A)

Published Date: 10/01/1986

MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/349) (S/S BY MIL-M-38510/349B)

Published Date: 01/03/2007

HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR(SUPERSEDING QML-38534-57)

Published Date: 03/27/2007

MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDNED, 8-CHANNEL SOURCE DRIVER, MONOLITHIC SILICON(SUPERSEDING DESC 5962-00520C)

Published Date: 09/15/2004

MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, OCTAL BUFFER WITH ACTIVE LOW ENABLE THREE-STATE NON-INVERTED OUTPUTS, MONOLITHIC SILICON (SUPERSEDING DESC 5962-91753)

Published Date: 08/30/2006

MICROCIRCUIT, LINEAR, 12-BIT SERIAL, DACPORT, MONOLITHIC SILICON(SUPERSEDING DSCC 5962-93204A)

Published Date: 02/15/1991

Rotating electrical machines - Part 16: Excitation systems for synchronous machines - Chapter 2: Models for power system studies

Published Date: 10/17/2014

Environmental testing - Part 3-12: Supporting documentation and guidance - Method to evaluate a possible lead-free solder reflow temperature profile

Published Date: 10/01/2022

Environmental testing - Part 3-12: Supporting documentation and guidance - Method to evaluate a possible lead-free solder reflow temperature profile

Published Date: 02/01/2024

Environmental testing – Part 3-15: Supporting documentation and guidance – Vacuum-assisted reflow soldering

Published Date: 08/01/2024

Environmental testing – Part 3-82: Supporting documentation and guidance – Confirmation of the performance of whisker test method

Published Date: 06/23/2004

Insulation co-ordination - Part 4: Computational guide to insulation co-ordination and modelling of electrical networks