Transistor, NPN, Silicon, Low-Power, Encapsulated (through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3019, 2N3057A, and 2N3700, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANK

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for the unencapsulated device types 2N3019, 2N3057, and 2N3700. Radiation hardness assurance (RHA) level designators ÛÏMÛ, ÛÏDÛ, ÛÏPÛÏ, ÛÏLÛ, ÛÏRÛ, ÛÏFÛ, ÛÏGÛ and ÛÏHÛ are appended to the device prefix to identify devices, which have passed RHA requirements.

File Size :	1 file , 1.2 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	40
Published :	10/14/2016

MIL MIL-PRF-19500/391P Amendment 1 (amendment incorporated) PDF

Transistor, NPN, Silicon, Low-Power, Encapsulated (through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3019, 2N3057A, and 2N3700, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANK

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