Transistor, NPN, Silicon, Low-Power, Encapsulated (through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3019, 2N3057A, and 2N3700, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANK

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

MIL-PRF-19500/391R covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for the unencapsulated device types 2N3019, 2N3057, and 2N3700. Radiation hardness assurance (RHA) level designators "UIM-U", "UID-U", "UIP-UI", "UIL-U", "UIR-U", "UIF-U", "UIG-U" and "UIH-U" are appended to the device prefix to identify devices, which have passed RHA requirements.

File Size :	1 file , 1.3 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	37
Published :	03/28/2019

MIL MIL-PRF-19500/391R PDF

Transistor, NPN, Silicon, Low-Power, Encapsulated (through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3019, 2N3057A, and 2N3700, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANK

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