MIL MIL-PRF-19500/415A PDF

Published Date: 05/17/2016

Transistor, NPN, Silicon, High Power, Stud Mount Case, Types 2N2812 and 2N2814, Quality Levels JAN, JANTX, and JANTXV

Published Date: 01/14/2015

Transistor, NPN, Silicon, High Power, Stud Mount Case, Types 2N2812 and 2N2814, Quality Levels JAN, JANTX, and JANTXV

Published Date: 10/31/2003

SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-POWER TYPES 2N2812 AND 2N2814 JAN, JANTX, AND JANTXV (SEE BASE FOR INACTIVATION NOTICE) (SUPERSEDING MIL-S-19500/415)

Published Date: 07/10/1969

SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH POWER TYPE JAN2N2812, JANTX2N2812, JAN2N2814 AND JANTX2N2814 (S/S BY MIL-PRF-19500/415A)

Published Date: 07/08/2020

Diode, Silicon, Types 1N483B, 1N485B, 1N486B, 1N5194, 1N5194UR, 1N5194US, 1N5195, 1N5195UR, 1N5195US, 1N5196, 1N5196UR, and 1N5196US, JAN, JANTX, and JANTXV

Published Date: 01/28/2014

Transistor, Quad, Field Effect, P-Channel and N-Channel, Silicon, 14-Pin Dual Inline Package, Type 2N7336, Quality Levels JAN, JANTX, JANTXV, and JANS

Published Date: 04/10/2020

Semiconductor Device, Transistor, PNP, Silicon, High-Power, Type 2N7369, JAN, JANTX, JANTXV, and JANS

Published Date: 04/01/1994

Advanced technical ceramics - Unified classification system

Published Date: 04/01/1997

Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures

Published Date: 09/01/2001

Polycrystalline materials - Determination of residual stresses by neutron diffraction

Published Date: 11/01/2002

Measurement of thermal conductivity of thin films on silicon substrates

Published Date: 10/01/2007

Code of practice for creep/fatigue testing of cracked components