MIL MIL-PRF-19500/434C PDF

Published Date: 08/15/2017

Semiconductor Device, Diode, Silicon, Transient Voltage Suppressor, Type 1N5610 through 1N5613, JAN, JANTX, JANTXV, and JANS

Published Date: 09/13/2011

Semiconductor Device, Diode, Silicon, Transient Voltage Suppressor, Type 1N5610 through 1N5613, JAN, JANTX, JANTXV, and JANS

Published Date: 05/18/2009

Semiconductor Device, Diode, Silicon, Transient Voltage Suppressor, Type 1N5610 through 1N5613, JAN, JANTX, JANTXV, and JANS

Published Date: 08/06/1999

SEMICONDUCTOR DEVICE, DIODE, SILICON, TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5610 THROUGH 1N5613 JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-S-19500/434B)

Published Date: 11/17/1992

SEMICONDUCTOR DEVICE, DIODE, SILICON, TRANSIENT VOLTAGE SUPPRESSOR TYPES 1N5610 THROUGH 1N5613 JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-S-19500/434A) (S/S BY MIL-PRF-19500/434C)

Published Date: 02/19/2016

Semiconductor Device, Diode, Silicon, Forward-Voltage Regulator, Axial Leaded Round Body Package, Type 1N816, Quality Level JAN

Published Date: 03/22/2018

Semiconductor Device, Diode, Silicon, Switching, Types 1N4148-1, 1N4148UR-1, 1N4148UB, 1N4148UBCA, 1N4148UBCC, 1N4148UBCCC, 1N4148UBD, 1N4148UBCD, 1N4148UB2, 1N4148UB2R, 1N914, 1N914UR, 1N4531, and 1N4531UR, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 01/01/2003

Food Quality and Safety Systems: A Training Manual on Food Hygiene and the Hazard Analysis and Critical Control Point (HACCP) System