MIL MIL-PRF-19500/437H PDF

Published Date: 12/05/2020

Semiconductor Device, Diode, Silicon, Low-Noise Voltage Regulator, Types 1N5518B-1, 1N5518C-1, 1N5518D-1 through 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 through 1N5546BUR-1, 1N5546CUR 1, 1N5546DUR-1, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 07/28/2019

Semiconductor Device, Diode, Silicon, Low-Noise Voltage Regulator, Types 1N5518B-1, 1N5518C-1, 1N5518D-1 through 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 through 1N5546BUR-1, 1N5546CUR 1, 1N5546DUR-1, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 03/25/2008

Semiconductor Device, Diode, Silicon, Low-Noise Voltage Regulator, Types 1N5518B-1, 1N5518C-1, 1N5518D-1 through 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 through 1N5546BUR-1, 1N5546CUR-1, 1N5546DUR-1, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 07/12/2006

SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR, TYPES 1N5518B-1, 1N5518C-1, 1N5518D-1 THROUGH 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 THROUGH 1N5546BUR-1, 1N5546CUR-1, 1N5546DUR-1, JAN, JANTX, JANTXV, JANHC, AND JANKC(SUPERSEDING MIL-PRF-19500/437F)

Published Date: 07/20/2005

SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR, TYPES 1N5518B-1, 1N5518C-1, 1N5518D-1 THROUGH 1N5546B-1, 1N5546C-1, 1N5546D-1, 1N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 THROUGH 1N5546BUR-1, 1N5546CUR-1, 1N5546DUR-1, JAN, JANTX, JANTXV, JANHC, AND JANKC (SUPERSEDING MIL-PRF-19500/437E)

Published Date: 10/18/2004

SEMICONDUCTOR DEVICE, DIODE, SILICON, LOW-NOISE VOLTAGE REGULATOR TYPES, 1N5518B-1, 1N5518C-1, 1N5518D-1 THROUGH 1N5546B-1, 1N5546C-1, 1N5546D-1, `N5518BUR-1, 1N5518CUR-1, 1N5518DUR-1 THROUGH 1N5546BUR-1, 1N5546CUR-1, 1N5546DUR-1 JAN, JANTX, JANTXV, JANHC (SUPERSEDING MIL-PRF-19500/437D) (S/S BY MIL

Published Date: 09/15/1997

SEMICONDUCTOR DEV,DIODE,SILICON,LOW-NOISE VOLTAGE REG TYPES,1N5518B-1,1N5518C-1,1N5518D-1-1N5546B-1,1N5546C-1,1N5546D-1,1N5518BUR-1,1N5518CUR-1,1N5518DUR-1-1N5546BUR-1,1N5546CUR-1,1N5546DUR-1,JAN, JANTX, JANTXV, JANHC,JANKC (SUPERSEDING MIL-S-19500/437C) (S/S BY MIL-PRF-19500/437E)

Published Date: 12/15/2005

TACTICAL OCEAN DATA LEVEL 0 (TOD0)(SUPERSEDING MIL-PRF-89049/10)

Published Date: 08/07/2015

Transistor, NPN, Silicon, Power, Type 2N3441, JAN, JANTX, and JANTXV

Published Date: 03/31/2008

Wrapping Materials, Volatile Corrosion Inhibitor Treated, Opaque

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings