MIL MIL-PRF-19500/496C PDF

Published Date: 10/21/2018

Semiconductor Device, Dual Transistor, PNP, Silicon Unitized, Types 2N5795, 2N5796, 2N5796U, 2N5796UC, 2N5795A, 2N5796A, 2N5796AU, and 2N5796AUC, JAN, JANS, JANSM, JANSD, JANSP, JANSL, JANSR, JANSF, JANSG, JANSH, JANTX, and JANTXV

Published Date: 06/01/2010

Semiconductor Device, Dual Transistor, PNP, Silicon Unitized, Types 2N5795, 2N5796, 2N5796U, 2N5796UC, 2N5795A, 2N5796A, 2N5796AU, and 2N5796AUC, JAN, JANS, JANSM, JANSD, JANSP, JANSL, JANSR, JANSF, JANSG, JANSH, JANTX, and JANTXV

Published Date: 03/25/2009

Semiconductor Device, Dual Transistor, PNP, Silicon Unitized, Types 2N5795, 2N5796, 2N5796U, 2N5796UC, 2N5795A, 2N5796A, 2N5796AU, and 2N5796AUC, JAN, JANS, JANSM, JANSD, JANSP, JANSL, JANSR, JANSF, JANSG, JANSH, JANTX, and JANTXV

Published Date: 03/31/2005

SEMICONDUCTOR DEVICE, DUAL TRANSISTOR, PNP, SILICON, UNITIZED, TYPES 2N5795, 2N5796, AND 2N5796U, JAN, JANTX, AND JANTXV (SUPERSEDING MIL-PRF-19500/496B)

Published Date: 09/15/1998

SEMICONDUCTOR DEVICE, TRANSISTOR, DUAL, PNP, UNITIZED, SILICON, TYPES 2N5795 2N5796 AND 2N5796U, JAN, JANTX AND JANTXV (SUPERSEDING MIL-S-19500/496A) (S/S BY MIL-PRF-19500/496C)

Published Date: 06/09/2003

SEMICONDUCTOR DEVICE, DIODE, SILICON, RECTIFER, MODULE, HIGH VOLTAGE, 1N5597, 1N560, 1N5603, TX AND TXV(SUPERSEDING MIL-PRF-19500/404C)

Published Date: 05/28/1998

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, P-CHANNEL SILICON TYPE 2N7438, AND 2N7439 JANSD AND JANSR

Published Date: 06/11/1990

SEMICONDUCTOR DEVICE, DIODE, GERMANIUM, SWITCHING TYPE 1N3666(1) JAN, JANTX, AND JANTXV (SUPERSEDING MIL-S-19500/226A)

Published Date: 10/12/1995

SEMICONDUCTOR DEVICE, FIELD-EFFECT TRANSISTOR, P-CHANNEL, SILICON TYPE 2N2607 (NO S/S DOCUMENT) (SUPERSEDING MIL-S-19500/294)

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings