MIL MIL-PRF-19500/535C PDF

Published Date: 06/05/2019

Transistor, PNP, Silicon, Power, Through Hole, Types 2N5003 and 2N5005, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 03/03/2016

Transistor, PNP, Silicon, Power, Through Hole, Types 2N5003 and 2N5005, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 05/30/2014

Transistor, PNP, Silicon, Power, Through Hole, Types 2N5003 and 2N5005, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 07/09/2013

Transistor, PNP, Silicon, Power, Through Hole, Types 2N5003 and 2N5005, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 07/31/2006

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON, POWER, TYPES 2N5003 AND 2N5005, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC(SUPERSEDING MIL-PRF-19500/535B)

Published Date: 12/20/1997

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON, POWER TYPES 2N5003, 2N5005, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC (SUPERSEDING MIL-S-19500/535A)(S/S BY MIL-PRF-19500/535C)

Published Date: 01/28/1994

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, SILICON, POWER TYPES 2N5003, 2N5005, JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC (S/S BY MIL-PRF-19500/535B) (SUPERSEDING MIL-S-19500/535)

Published Date: 06/02/2006

SEMICONDUCTOR DEVICE, DIODE, SILICON, MIXER, 1N23WE, 1N23WEM AND 1N23WEMR 1N23WG, 1N23WGM AND 1N23WGMR(SUPERSEDING DSCC 01037)

Published Date: 04/14/2016

Semiconductor Device, Diode, Silicon, Voltage Regulator, Case Mount through Hole Package, Standard and Reverse Polarity, Types 1N2804 through 1N2811, 1N2813, 1N2814, 1N2816,1N2818 through 1N2820

Published Date: 01/20/2020

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL, SILICON, TYPES 2N7494U5, 2N7495U5, AND 2N7496U5, JANTXVR, F, G, AND H, AND JANSR, F, G, AND H

Published Date: 04/15/1970

SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, SWITCHING, LOW-POWER TYPE 2N706 (SUPERSEDING MIL-S-19500/120B)

Published Date: 02/01/2006

Information technology - Automatic identification and data capture techniques - Bar code print quality test specification - Two-dimensional symbols (ISO/IEC 15415:2004)

Published Date: 05/30/2002

Information technology. Automatic identification and data capture techniques. Bar code print quality test specification. Linear symbols. (ISO/IEC 15416:2000)

Published Date: 06/28/2002

Information technology. Automatic identification and data capture techniques. Bar code digital imaging and printing performance testing. (ISO/IEC 15419:2001)

Published Date: 05/29/2002

Information technology. Automatic identification and data capture techniques. Bar code master test specifications. (ISO/IEC 15421:2000)

Published Date: 02/08/2006

Information technology - Automatic identification and data capture techniques - Bar code scanner and decoder performance testing (ISO/IEC 15423:2004)

Published Date: 11/24/2010

Information technology - Automatic identification and data capture techniques - Bar code scanner and decoder performance testing (ISO/IEC 15423:2009)