MIL MIL-PRF-19500/567D PDF

Published Date: 12/10/2012

Semiconductor Device, Diode, Silicon, Schottky Barrier, Fast Recovery, Type 1N6492, 1N6492U4, JAN, JANTX, JANTXV, and JANS

Published Date: 02/08/2008

Semiconductor Device, Diode, Silicon, Schottky Barrier, Fast Recovery, Type 1N6492, 1N6492U4, JAN, JANTX, JANTXV, and JANS

Published Date: 09/12/2003

SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY BARRIER, FAST RECOVERY, TYPE 1N6492, 1N6492U4, JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-PRF-19500/567B)

Published Date: 07/20/2001

SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY BARRIER, FAST RECOVERY TYPE 1N6492, JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-PRF-19500/567A) (S/S BY MIL-PRF-19500/567C)

Published Date: 07/26/1999

SEMICONDUCTOR DEVICE, DIODE, SILICON, SCHOTTKY BARRIER, FAST RECOVERY TYPE 1N6492, JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-S-19500/567) (S/S BY MIL-PRF-19500/567B)

Published Date: 10/23/2018

Semiconductor Device, Field Effect Transistor, P-Channel, Radiation Hardened (Total Dose and Single Event Effects), Logic-Level Silicon, Types 2N7626UB, 2N7626UBC, 2N7626UBN, 2N7626UBCN, JANTXVR, JANTXVF, JANSR, and JANSF

Published Date: 03/10/2008

Connector, Electrical, Receptacle, Radio Frequency, High Reliability, Coaxial, Series BMZ, Right Angle, Pin Contact, for Semirigid Cable

Published Date: 01/01/1993

Micrographics — Readers - Printers for transparent microforms — Characteristics

Published Date: 01/01/1994

Micrographics — Rotary camera for 16mm microfilm — Mechanical and optical characteristics

Published Date: 01/01/2009

Standard Recommended Practice Markup Language – Part 1: Stratml Core

Published Date: 01/01/1993

Micrographics — Readers for transparent microforms — Performance characteristics

Published Date: 01/01/1993

Micrographics — Readers for transparent microforms — Measurement of characteristics

Published Date: 01/01/1987

Method for Determining Adhesion of Protection Sheet to Aperture Adhesive of Unitized Microfilm Carrier (Aperture Card)