MIL MIL-PRF-19500/607A PDF

Published Date: 08/06/2004

SEMICONDUCTOR DEVICE, FIELD EFFECT TRANSISTORS, N-CHANNEL AND P-CHANNEL, SILICON, TYPE 2N7337 JAN, JANTX, JANTXV, JANS, AND JANHC (SUPERSEDING MIL-PRF-19500/607A)

Published Date: 02/11/1998

SEMICONDUCTOR DEVICE, FIELD EFFECT TRANSISTORS, N-CHANNEL AND P-CHANNEL, SILICON TYPE 2N7337 JANTX, JANTXV, JANS, AND JANC (SUPERSEDING MIL-S-19500/607) (S/S BY MIL-PRF-19500/607B)

Published Date: 07/08/2020

Diode, Silicon, Types 1N483B, 1N485B, 1N486B, 1N5194, 1N5194UR, 1N5194US, 1N5195, 1N5195UR, 1N5195US, 1N5196, 1N5196UR, and 1N5196US, JAN, JANTX, and JANTXV

Published Date: 08/30/2015

Transistor, NPN, Silicon, Switching, Encapsulated (Through-Hole and Surface Mount), and Unencapsulated, Radiation Hardness Assurance, Types 2N2369A, 2N3227, 2N4449, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, JANKC

Published Date: 08/27/2015

Transistor, NPN, Silicon, High-Power, Types 2N3771 and 2N3772, Quality Levels JAN, JANTX, and JANTXV

Published Date: 04/26/2019

Semiconductor Device, Transistor, NPN, Silicon, Power Darlington, Types 2N6350, 2N6351, 2N6352, and 2N6353, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings