MIL MIL-PRF-19500/645E PDF

Published Date: 09/11/2018

Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS

Published Date: 10/31/2013

Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS

Published Date: 08/24/2007

Semiconductor Device, Diode, Silicon, Power Rectifier, Dual, Common Cathode or Anode Center Tap, Ultrafast, Types 1N6772, 1N6773, 1N6772R and 1N6773R JAN, JANTX, JANTXV, and JANS

Published Date: 10/24/2005

SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL, COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST, TYPES 1N6772, 1N6773, 1N6772R AND 1N6773R JAN, JANTX, JANTXV, AND JANS(SUPERSEDING MIL-PRF-19500/645A)

Published Date: 08/16/1998

SEMICONDUCTOR DEVICE, DIODE, SILICON, POWER RECTIFIER, DUAL, COMMON CATHODE OR ANODE CENTER TAP, ULTRAFAST, TYPES 1N6772, 1N6773, 1N6772R AND 1N6773R, JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-PRF-19500/645)(S/S BY MIL-PRF-19500/645B)

Published Date: 03/18/2009

Connectors, Electrical, Rectangular, Plug, Microminiature, Polarized Shell, Straight, Pin Contacts, 3 Row, Solder Type, Standard Profile, 51 Contacts, Printed Circuit Board

Published Date: 01/01/2004

Experimental structural analysis - Recommended practice for high-temperature strain measurements

Published Date: 10/01/2000

Certification of courses and examinations in strain gage measurement technology