MIL MIL-PRF-19500/674 PDF

Published Date: 02/19/1968

SEMICONDUCTOR DEVICE, DIODE, TYPE 1N560 AND 1N561 (NAVY) (SUPERSEDING MIL-S-19500/167A)

Published Date: 06/02/2017

Semiconductor Device, Transistor, NPN, Silicon, Switching, Types 2N3506, 2N3506A, 2N3506L, 2N3506AL, 2N3506U4, 2N3506AU4, 2N3507, 2N3507L, 2N3507A, 2N3507AL, 2N3507U4, AND 2N3507AU4

Published Date: 09/16/1997

Dependability Management - Part 3:Application Guide - Section 1 - Analysis Techniques for Dependability

Published Date: 09/16/1997

Dependability Management - Part 3:Application Guide - Collection of Dependability Data

Published Date: 09/16/1997

Compliance Test Procedures for Steady-State Availability

Published Date: 09/16/1997

Analysis Techniques for Dependability - Reliability Block Diagram Method

Published Date: 09/16/1997

Reliability Testing - Compliance Plans for Success Ratio

Published Date: 09/16/1997

Reliability Growth - Statistical Test and Estimation Methods