MIL MIL-PRF-19500/692 PDF

Published Date: 07/29/2015

Transistor, Field Effect, N-Channel, Silicon, Types 2N7515, 2N7516, and 2N7517, JANTXV and JANS

Published Date: 09/10/2004

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATIN HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR, N-CHANNEL SILICON, TYPES 2N7515, 2N7516, AND 2N7517, JANTXVD, R, AND JANSR, R (SUPERSEDING MIL-PRF-19500/692)

Published Date: 03/08/2001

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS N-CHANNEL, SILICON TYPES 2N7515, 2N7516, AND 2N7517 JANTXVD, R AND JANSD, R (S/S BY MIL-PRF-19500/692A)

Published Date: 06/09/2020

Transistor, PNP, Silicon, High-Power, Encapsulated (Through Hole), Device Types 2N3791 and 2N3792, Quality Levels: JAN, JANTX, JANTXV, and JANS

Published Date: 10/03/1966

SEMICONDUCTOR DEVICE, DIODE, SILICON, MIXER TYPES 1N1132 AND 1N1132R

Published Date: 11/30/2006

Code of inspection practice-Inspection of corresponding flanks of gear teeth

Published Date: 12/29/2006

Code of inspection practice-Inspection related to radial composite deviations, runout, tooth thickness and backlash

Published Date: 11/30/2006

Code of inspection practice-Recommendations relative to gear blanks, shaft centre distance and parallelism of axes

Published Date: 11/30/2006

Code of inspection practice-Recommendations relative to surface texture and tooth contact pattern checking

Published Date: 01/15/1996

Round general use light gauge metal containers. Nominal filling volumes and nominal diameters

Published Date: 01/15/1996

Non-round general use light gauge metal containers. Nominal filling volumes and nominal cross-sections