MIL MIL-PRF-19500/713E PDF

Published Date: 11/19/2018

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 04/25/2018

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 06/08/2007

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F (SUPERSEDING MIL-PRF-19500/713)

Published Date: 04/28/2005

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 02/14/2020

Transistor, Unitized Dual, NPN, Silicon, Types 2N2919, 2N2920, JAN, JANTX, JANTXV, JANS, JANHC and JANKC

Published Date: 05/04/2011

Wireless systems for industrial automation: Process control and related applications

Published Date: 01/01/2009

Wireless systems for industrial automation: Process control and related applications

Published Date: 07/09/2015

Human Machine Interfaces for Process Automation Systems

Published Date: 06/15/2023

Procedure Automation for Continuous Process Operations

Published Date: 01/29/2013

Industry Standard File Format for Revolution-Based Tip Timing Data

Published Date: 07/15/1999

Electrical Apparatus for Use in Class I, Zones 0, 1, & 2 Hazardous (Classified) Locations - General Requirements