MIL MIL-PRF-19500/713E PDF

Published Date: 11/19/2018

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 04/25/2018

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 06/08/2007

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F (SUPERSEDING MIL-PRF-19500/713)

Published Date: 04/28/2005

SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTORS, P-CHANNEL, SILICON, TYPES 2N7549T1, 2N7549U2, 2N7550T1, AND 2N7550U2, JANTXVR, F AND JANSR, F

Published Date: 02/14/2020

Transistor, Unitized Dual, NPN, Silicon, Types 2N2919, 2N2920, JAN, JANTX, JANTXV, JANS, JANHC and JANKC

Published Date: 08/18/1967

A Code of Good Practices for the Performance of Critical Experiments

Published Date: 08/19/1971

Safety Guide for the Performance of Critical Experiments

Published Date: 04/29/1975

Safety Guide for the Performance of Critical Experiments

Published Date: 06/24/1987

Safety Guide for the Performance of Critical Experiments

Published Date: 03/23/2000

Conduct of Critical Experiments

Published Date: 04/01/1971

Recommended Programming Practices to Facilitate the Interchange of Digital Computer Programs