Semiconductor Device, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC

Publisher:
Military Specifications and Standards

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

MIL-PRF-19500/741B covers the performance requirements for N-channel and P-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

File Size :	1 file , 260 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	19
Published :	04/13/2018

MIL MIL-PRF-19500/741B PDF

Semiconductor Device, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC

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