MIL MIL-PRF-55310/10J PDF

Published Date: 06/11/2009

Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL

Published Date: 02/24/2005

OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/10G)

Published Date: 07/08/2002

OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1KHZ THROUGH 60 MHZ, HERMETIC SEAL, SQUARE WAVE, TTL (SUPERSEDING MIL-PRF-55310/10F) (S/S BY MIL-PRF-55310/10H)

Published Date: 05/15/2002

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON (SUPERSEDING DSCC 5962-97524)

Published Date: 01/17/2014

Copper Rod for Crusher Cylinders

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings