MIL MIL-S-19500/237A PDF

Published Date: 04/14/2016

Semiconductor Device, Diode, Silicon, Voltage Regulator, Case Mount through Hole Package, Standard and Reverse Polarity, Types 1N2804 through 1N2811, 1N2813, 1N2814, 1N2816,1N2818 through 1N2820

Published Date: 05/29/2015

Transistor, PNP, Silicon, Switching, Encapsulated (Through Hole and Surface Mount) and Unencapsulated, Radiation Hardness Assurance, Device Types 2N3762, 2N3763, 2N3764, and 2N3765, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC and JANKC JANHCA, and JANKCA

Published Date: 06/24/2019

Transistor, PNP, Silicon Amplifier, Types 2N5679 and 2N5680, JAN, JANTX and JANTXV

Published Date: 07/13/2023

Additive manufacturing of metals - Non-destructive testing and evaluation - Defect detection in parts (ISO/ASTM TR 52905:2023)

Published Date: 07/01/2022

Additive manufacturing - Non-destructive testing - Intentionally seeding flaws in metallic parts (ISO/ASTM/TR 52906:2022)

Published Date: 10/21/2020

Additive manufacturing - Design - Functionally graded additive manufacturing (ISO/ASTM/TR 52912:2020)

Published Date: 03/01/2022

Additive manufacturing for medical - Data - Optimized medical image data (ISO/ASTM TR 52916:2022)

Published Date: 11/28/2022

Additive manufacturing - Round robin testing - General guidelines (ISO/ASTM TR 52917:2022)

Published Date: 07/25/2023

Additive Manufacturing of metals - Feedstock materials - Correlating of rotating drum measurement with powder spreadability in PBF-LB machines (ISO/ASTM TR 52952:2023)