MIL MIL-S-19500/378B PDF

Published Date: 03/19/2007

SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR(SUPERSEDING QML-19500-30)

Published Date: 02/22/2013

Transistor, NPN, Silicon, Switching, Types 2N2221, 2N2222, JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 07/10/2018

Semiconductor Device, Transistor, PNP, Silicon, Switching, Types, 2N2904, 2N2904A, 2N2904AL, 2N2905, 2N2905A, and 2N2905AL, JAN, JANTX, JANTXV, JANS, JANTXVM, JANTXVD, JANTXVP, JANTXVL, JANTXVR, JANTXVF, JANTXVG, JANTXVH, JANSM, JANSD, JANSP, JANSL, JANSR, JANSF, JANSG, and JANSH

Published Date: 06/07/2018

Semiconductor Device, Field Effect Radiation Hardened Transistors, N-Channel, Silicon, Types 2N7465T3 and 2N7466T3 and U3 Suffixes, JANTXVR and JANSR

Published Date: 12/01/1975

Test methods for metallic materials - Part 3 : Load calibration of tensile testing machines

Published Date: 01/31/2000

Metallic materials - Test methods - Part 6 : Bend testing

Published Date: 05/31/1991

Test methods for metallic materials - Tube used under pressure - Part 17 : Integrity test

Published Date: 05/31/1991

Test methods for metallic materials - Part 18 : Hydraulic distension test for tube

Published Date: 02/29/1996

Test methods for metallic materials - Part 20: Eddy current testing of circular cross-section tubes

Published Date: 01/31/2000

Metallic materials - Test methods - Part 21 : Radiographic testing of castings