MIL MIL-S-19500/445B PDF

Published Date: 01/04/1994

SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPES 1N5712, 1N5712-1, AND 1N5712UR-1 JAN, JANTX, JANTXV, JANS, JANHC AND JANKC (SUPERSEDING MIL-S-19500/445B) (S/S BY MIL-PRF-19500/445D)

Published Date: 11/24/1992

SEMICONDUCTOR DEVICE, DIODE, SILICON, SWITCHING TYPES 1N5712, 1N5712-1, AND 1N5712UR-1, JAN, JANTX, JANTXV, JANS, AND JANC (S/S BY MIL-S-19500/445C) (SUPERSEDING MIL-S-19500/445A)

Published Date: 05/19/1983

DISPLAYS, DIODE, LIGHT EMITTING, SOLID STATE, RED, NUMERIC AND HEXADECIMAL, WITH ON BOARD DECODER/DRIVER (S/S BY MIL-PRF-19500/708)

Published Date: 10/21/1996

SEMICONDUCTOR DEVICE, DIODE, GALLIUM ARSENIDE, POWER RECTIFIER, COMMON CATHODE TYPE 1N6755 JANTX, JANTXV AND JANS (NO S/S DOCUMENT)

Published Date: 04/01/1997

SEMICONDUCTOR DEVICE, DIODE, GALLIUM ARESENIDE, POWER RECTIFIER, TYPE 1N6757, JANTX, JANTXV, AND JANS (NO S/S DOCUMENT)

Published Date: 11/18/1966

SEMICONDUCTOR, DEVICE TRANSISTOR, PNP, GERMANIUM, LOW POWER TYPE 2N331 (SUPERSEDING MIL-S-19500/4C)

Published Date: 09/16/1997

Dependability Management - Part 3:Application Guide - Section 1 - Analysis Techniques for Dependability

Published Date: 09/16/1997

Dependability Management - Part 3:Application Guide - Collection of Dependability Data

Published Date: 09/16/1997

Compliance Test Procedures for Steady-State Availability

Published Date: 09/16/1997

Analysis Techniques for Dependability - Reliability Block Diagram Method

Published Date: 09/16/1997

Reliability Testing - Compliance Plans for Success Ratio

Published Date: 09/16/1997

Reliability Growth - Statistical Test and Estimation Methods