MIL MIL-S-19500/547A PDF

Published Date: 06/30/2020

Semiconductor Device, Field Effect Transistor, N-Channel, Silicon, Types 2N6660 and 2N6661, JAN, JANTX, JANTXV, and JANS

Published Date: 09/23/2019

Semiconductor Device, Field Effect Transistor, N-Channel, Silicon, Types 2N6660 and 2N6661, JAN, JANTX, JANTXV, and JANS

Published Date: 08/29/2011

Semiconductor Device, Field Effect Transistor, N-Channel, Silicon, Types 2N6660 and 2N6661, JAN, JANTX, JANTXV, and JANS

Published Date: 06/24/2009

Semiconductor Device, Field Effect Transistor, N-Channel, Silicon, Types 2N6660 and 2N6661, JAN, JANTX, JANTXV, and JANS

Published Date: 07/30/1999

SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-S-19500/547A)

Published Date: 01/29/1988

SEMICONDUCTOR DEVICE, FIELD EFFECT TRANSISTOR, N-CHANNEL, SILICON TYPES 2N6660 AND 2N6661 JAN, JANTX, JANTXV, AND JANS (SUPERSEDING MIL-S-19500/547) (S/S BY MIL-PRF-19500/547B)

Published Date: 06/24/2020

Semiconductor Device, Silicon, Switching, Types 1N4153-1, 1N4153UR-1, 1N4153UB, 1N4153UBCA, 1N4153UBCC, 1N4153UBD, 1N4153UBN, 1N4153UBND, 1N4534, and 1N4534UB, JAN, JANTX, JANTXV, JANHC, and JANKC

Published Date: 02/05/1993

SEMICONDUCTOR DEVICE, FIELD-EFFECT TRANSISTOR, P-CHANNEL, SILICON TYPE 2N2609 (SUPERSEDING MIL-S-19500/296A)

Published Date: 01/08/2013

Allied Ammunition Safety and Suitability for Service Assessment Testing Publication - Guidance

Published Date: 01/08/2013

Safety and Suitability for Service Assessment Testing for Shoulder Launched Munitions

Published Date: 11/07/2014

Safety and Suitability for Service Assessment Testing for Shoulder Launched Munitions

Published Date: 05/09/2016

Safety and Suitability for Service Assessment Testing for Shoulder Launched Munitions

Published Date: 12/05/2014

Safety and Suitability for Service Assessment Testing for Surface and Underwater Launched Munitions

Published Date: 07/01/2013

Safety and Suitability for Service Assessment Testing for Aircraft Launched Munitions