MIL MIL-STD-600011 PDF

Published Date: 10/28/2014

Semiconductor Device, Thyristors, Types 2N1870A, 2N1871A, 2N1872A, and 2N1874A, JAN

Published Date: 09/25/2015

Transistor, NPN Silicon, Low-Power, through-Hole Mount, Surface Mount, and Unencapsulated Die, Type 2N918, Quality Levels JAN, JANTX, JANTXV, JANS, JANHC, and JANKC

Published Date: 06/07/2018

Semiconductor Device, Field Effect Radiation Hardened Transistors, N-Channel, Silicon, Types 2N7465T3 and 2N7466T3 and U3 Suffixes, JANTXVR and JANSR

Published Date: 08/18/1967

A Code of Good Practices for the Performance of Critical Experiments

Published Date: 08/19/1971

Safety Guide for the Performance of Critical Experiments

Published Date: 04/29/1975

Safety Guide for the Performance of Critical Experiments

Published Date: 06/24/1987

Safety Guide for the Performance of Critical Experiments

Published Date: 03/23/2000

Conduct of Critical Experiments

Published Date: 04/01/1971

Recommended Programming Practices to Facilitate the Interchange of Digital Computer Programs