MODUK DEF STAN 05-71: PART 2 PDF

Coverage

This part of Def Stan 05–71 establishes single sampling plans and procedures for inspection by variables of the accuracy of one-shot devices, when disturbances in azimuth and elevation are independent, or approximately so. These plans are not suitable for acceptance inspection for consistency, for they take account of the deviation of the sample mean point of impact from the point of aim. (Sampling procedures for consistency proof are given in Def Stan 05–71 Part 1.)

Objective

The object of the methods laid down in this Defence Standard is to ensure that lots of acceptable quality have a high probability of acceptance and that lots of inferior quality have as low a probability of acceptance as possible.

Lot Quality

The fraction of nonconforming devices in a lot is used to define the quality of the lot and reflects the capability of the production process that generated it. (See 3(a).)