NEN NEN-EN-IEC 60749-1 PDF

Name:
NEN NEN-EN-IEC 60749-1 PDF

Published Date:
08/01/2003

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Publisher:
Nederlands Normalisatie Instituut

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

BILINGUAL EN/FR * SAME AS IEC 60749-1:2002

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. In the case of contradiction between this standard and a relevant procurement specification, the latter should govern.

Edition :	03
File Size :	1 file , 240 KB
Number of Pages :	30
Published :	08/01/2003

History

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