MOIRE TECHNOLOGY IS A SIGNIFICANT ADVANCEMENT IN NONCONTACT X-Y-Z SURFACE MAPPING TECHNIQUES FROM LASER LINE SCANNING AND LASER POINT TRIANGULATION METHODS. THE MINIATURIZATION OF THE SENSOR PERMITS UTILIZATION WITH OFF- THE-SHELF COORDINATE MEASURING MACHINES (CMMS) AND THE STANDARD TOUCH PROBE PAN/TILT HEADS. APPLICATIONS FOR THE SURFACE MAPPING OF COMPLEX FORMED PARTS ARE DISCUSSED INCLUDING INSPECTION AND REVERSE ENGINEERING FUNCTIONS.
