Coordinate measuring machines are used for a wide variety of measurement applications. For some of these applications, non-contact optical probes have many advantages over contact probes, however, because of the wide range of parameters required to characterize an optical probe, many CMM users choose to avoid this new technology. This paper addresses the various characteristics of optical probes for CMMs and the probe and application characteristics that should be taken into account when selecting a probe.
| Number of Pages : | 5 |
| Published : | 11/01/1999 |
