The reverse engineering of free-form surfaces has seen tremendous growth with the use of non-contact probes. However, when reverse engineering free-form surfaces a perennial question is the limit on the number of points to be measured and the size of the grid in which the points are measured. This research describes an integrated reverse engineering system that measures a free-form surface using a contact probe and iteratively performs the data measured. This method reduces the number of data points that are measured.
| Number of Pages : | 6 |
| Published : | 11/01/2000 |
