THIS PAPER EXAMINES THE FUNDAMENTAL QUESTIONS REGARDING PROBE PERFORMANCE ON CMMS. IT DETAILS THE ERROR SOURCES WHICH ARE PRESENT AND EXPLAINS THE ASSOCIATED TERMINOLOGY. THE ERROR SOURCES ARE EVALUATED AND THEIR SIGNIFICANCE TO ACTUAL PART MEASUREMENT IS DISCUSSED. PROBE TECHNOLOGIES ARE COMPARED AND CONTRASTED. FINALLY, A DISCUSSION OF FUTURE TRENDS FOR CMMS AND PROBES IS PRESENTED.
