SPC GB/T 26068-2018 PDF

Name:
SPC GB/T 26068-2018 PDF

Published Date:
11/01/2019

Status:
Active

Description:

Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)

Publisher:
Standards Press of China

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 2.8 MB
Number of Pages :	32
Published :	11/01/2019

History

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SPC GB/T 26068-2018 PDF

Test method for carrier recombination lifetime in silicon wafers and silicon ingots -- Non-contact measurement of photoconductivity decay by microwave reflectance method (TEXT OF DOCUMENT IS IN CHINESE)

History

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