TIA ANSI/TIA-455-130 PDF

TIA ANSI/TIA-455-130 PDF

Name:
TIA ANSI/TIA-455-130 PDF

Published Date:
03/01/2001

Status:
[ Revised ]

Description:

Elevated Temperature Life Test for Laser Diodes

Publisher:
Telecommunications Industry Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$24.3
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Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.


ANSI : ANSI Approved
Edition : 01
File Size : 1 file , 160 KB
Number of Pages : 18
Published : 03/01/2001

History

TIA TIA-455-130
Published Date: 03/01/2001
Elevated Temperature Life Test for Laser Diodes
$24.3
TIA ANSI/TIA-455-130
Published Date: 03/01/2001
Elevated Temperature Life Test for Laser Diodes
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TIA ANSI/TIA/EIA-455-130
Published Date: 03/01/2001
FOTP-130 Elevated Temperature Life Test for Laser Diodes
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